Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location-Reference-Cited by-同舟云学术

Unsupervised image processing scheme for transistor photon emission analysis in order to identify defect location

Published:2015-01-27 Issue:1 Volume:24 Page:013019
ISSN:1017-9909
Container-title:Journal of Electronic Imaging
language:en
Short-container-title:J. Electron. Imaging

Author:

Chef Samuel¹,Jacquir Sabir²,Sanchez Kevin³,Perdu Philippe³,Binczak Stéphane²

Affiliation:

1. Université de Bourgogne, Le2i UMR CNRS 6306, 9 Avenue Alain Savary, Dijon 21000, FrancebCNES, French Space Agency, 18 Avenue Edouard Belin, Toulouse 31401, France

2. Université de Bourgogne, Le2i UMR CNRS 6306, 9 Avenue Alain Savary, Dijon 21000, France

3. CNES, French Space Agency, 18 Avenue Edouard Belin, Toulouse 31401, France

Publisher

SPIE-Intl Soc Optical Eng

Subject

Electrical and Electronic Engineering,Computer Science Applications,Atomic and Molecular Physics, and Optics

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