Nonlinear forced response of piezoelectric microcantilevers with application to tapping mode atomic force microscopy-Reference-Cited by-同舟云学术

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Nonlinear forced response of piezoelectric microcantilevers with application to tapping mode atomic force microscopy

Published:2014-03-09 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

McCarty Rachael,Mahmoodi S. Nima

Publisher

SPIE

Reference31 articles.

1. Modeling Piezoresponse Force Microscopy for Low-Dimensional Material Characterization: Theory and Experiment;Salehi-Khojin,2009

2. Lekka, M., and Wiltowska-Zuber, J., “Biomedical Applications of AFM”, JPCS 146, 012023.

3. Coupled Flexural-Torsional Nonlinear Vibrations of Piezoelectrically Actuated Microcantilevers With Application to Friction Force Microscopy

4. Modelling of the scan process in lateral force microscopy

5. Characterization of sputtered ZnO thin film as sensor and actuator for diamond AFM probe

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