Scatter measurement and correction method for cone-beam CT based on single grating scan-Reference-Cited by-同舟云学术

Scatter measurement and correction method for cone-beam CT based on single grating scan

Published:2017-06-29 Issue:6 Volume:56 Page:064106
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Huang Kuidong¹,Shi Wenlong¹,Wang Xinyu¹,Dong Yin²,Chang Taoqi²,Zhang Hua³,Zhang Dinghua¹

Affiliation:

1. Northwestern Polytechnical University, Key Laboratory of Contemporary Design and Integrated Manufacturing Technology of the Education Ministry of China, Xi’an, China

2. CAPC Xi’an Precision Casting Co., Ltd., Xi’an, China

3. Northwestern Polytechnical University, School of Mechanical Engineering, Xi’an, China

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

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