Accuracy enhanced distance measurement system using double-sideband modulated frequency scanning interferometry-Reference-Cited by-同舟云学术

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Accuracy enhanced distance measurement system using double-sideband modulated frequency scanning interferometry

Published:2017-03-25 Issue:3 Volume:56 Page:036114
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Chen Xilun¹,Wang Xiangchuan¹,Pan Shilong¹

Affiliation:

1. Nanjing University of Aeronautics and Astronautics, Key Laboratory of Radar Imaging and Microwave Photonics, Ministry of Education, Nanjing, China

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Axial clearance measurement method based on time-frequency analysis for high-speed targets in narrow spaces;Optics Express;2024-08-21

2. Correlation Demodulation for Low- Finesse Fabry-Pérot Sensors Based on Microwave Photonics;Journal of Lightwave Technology;2024-05-15

3. Effect of principal environmental parameters on performance of LFMCW photonic radar during transmission;Measurement Science and Technology;2022-12-21

4. Theoretical investigation of DFSI with immunity to both Doppler effect and frequency-sweep nonlinearity;Optoelectronics Letters;2022-11

5. Dynamic Distance Measurement Based on a Fast Frequency-Swept Interferometry;Sensors;2022-06-24

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