Femtosecond laser-induced damage threshold of electron beam deposited dielectrics for 1-m class optics-Reference-Cited by-同舟云学术

Femtosecond laser-induced damage threshold of electron beam deposited dielectrics for 1-m class optics

Published:2016-06-30 Issue:1 Volume:56 Page:011001
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Hervy Adrien¹,Gallais Laurent²,Chériaux Gilles³,Mouricaud Daniel⁴

Affiliation:

1. Reosc (SAFRAN Group), 91280 Saint-Pierre-du-Perray, FrancebAix Marseille Université, CNRS, Centrale Marseille, Institut Fresnel, UMR 7249, 13397 Marseille, FrancecENSTA, Laboratoire d’Optique Appliquée, Ecole Polytechnique, CNRS UMR 7639, 91761 Palaiseau,

2. Aix Marseille Université, CNRS, Centrale Marseille, Institut Fresnel, UMR 7249, 13397 Marseille, France

3. ENSTA, Laboratoire d’Optique Appliquée, Ecole Polytechnique, CNRS UMR 7639, 91761 Palaiseau, France

4. Reosc (SAFRAN Group), 91280 Saint-Pierre-du-Perray, France

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference34 articles.

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