Random (Speckle) Patterns For Displacement And Strain Measurement: Some Recent Advances-Reference-Cited by-同舟云学术

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Random (Speckle) Patterns For Displacement And Strain Measurement: Some Recent Advances

Published:1985-12-01 Issue:6 Volume:24 Page:
ISSN:0091-3286
Container-title:Optical Engineering
language:en
Short-container-title:Opt. Eng

Author:

Chiang F. P.,Li D. W.

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Cited by 16 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Optoelectronic imaging of speckle using image processing method;2017 International Conference on Optical Instruments and Technology: Optoelectronic Imaging/Spectroscopy and Signal Processing Technology;2018-01-12

2. Electronic Speckle Pattern Interferometry techniques for non-destructive evaluation: a review;Insight - Non-Destructive Testing and Condition Monitoring;2006-05

3. Speckle and Speckle Metrology;digital Encyclopedia of Applied Physics;2004-10-15

4. Maximum diameter of the read-out laser beam in double-exposure speckle photography;Optics Communications;2003-06

5. Dynamic measurements of internal three-dimensional displacement fields with digital speckle photography and flash x rays;Applied Optics;1999-10-01

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