Author:
Park Yong-Hee,Kim Dong-Hyun,Choi Jung-Hoe,Hong Ji-Suk,Park Chul-Hong,Lee Sang-Hoon,Yoo Moon-Hyun,Cho Jun-Dong
Cited by
2 articles.
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1. A Novel ML Augmented DRC Framework for Identification of Yield Detractor Patterns;IEEE Transactions on Semiconductor Manufacturing;2021-08
2. Hotspot detection based on surrounding optical feature;Design-Process-Technology Co-optimization for Manufacturability XII;2018-03-20