Ink layer thickness detection based on laser triangulation technology

Author:

Zhang Weipeng,Wu Shuqin,Zhuang Yanyan,Chai Chengwen,Li Jialin

Publisher

SPIE

Reference5 articles.

1. SUN Yi-xiu, ZENG Jun-jie, CHEN Min-sheng. Electrical Contact Detection Method Based on Machine Vision [J]. Image and Visual Computing, 2010(28):890–901.

2. On-line thin film thickness monitor by pulsed laser photo acoustics[J];MAHMUDUR;Optics and Lasers in Engineering,2021

3. Study on the Relationship between Ink volume and Density Based on nonlinear regression Analysis [J];Qiang;Printing and packaging technology.,2019

4. An exact ray model for oblique incident light on planar films[J];MAREN;Low-dimensional Systems and Nanostructures,2021

5. XU Xiang-yang, XU Sheng-zhou, JIN Liang-hai, SONG En-min. Analysis of Otsu Threshold Characteristics and its application [J]. Journal of Pattern Recognition, 62011(32):956–961.

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