A pattern- and optics-independent compact model of Mask3D under off-axis illumination with significant efficiency and accuracy improvements

Author:

Zhang Hongbo,Yan Qiliang,Wei David,Croffie Ebo

Publisher

SPIE

Reference14 articles.

1. Fast and accuate 3D mask model for full-chip OPC and verification,;Liu,2007

2. Full-chip OPC and verification with a fast mask 3D model,;Huang,2011

3. A full-chip 3D computational lithography framework,;Liu,2012

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1. EUV光刻三维掩模成像研究进展;Laser & Optoelectronics Progress;2022

2. Fast EUV lithography simulation using convolutional neural network;Journal of Micro/Nanopatterning, Materials, and Metrology;2021-09-24

3. Fast 3D lithography simulation by convolutional neural network;Design-Process-Technology Co-optimization XV;2021-02-22

4. Fast 3D lithography simulation by convolutional neural network: POC study;Photomask Technology 2020;2020-09-20

5. Deep learning assisted fast mask optimization;Optical Microlithography XXXI;2018-03-20

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