Author:
Rengel Raul,Pardo Daniel,Martin Maria J.
Cited by
3 articles.
订阅此论文施引文献
订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Do hot electrons cause excess noise?;Solid-State Electronics;2006-04
2. Numerical modeling of RF noise in scaled MOS devices;Solid-State Electronics;2006-01
3. Do hot electrons produce excess noise?;Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005.