Analysis on morphological and structural features of graphene layers by using polarization indirect microscopic imaging system
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Publisher
SPIE
Reference23 articles.
1. High-resolution scanning tunneling microscopy imaging of mesoscopic graphene sheets on an insulating surface;Stolyarova,2007
2. Graphene Field-Effect Transistors with High On/Off Current Ratio and Large Transport Band Gap at Room Temperature
3. Graphene-layered steps and their fields visualized by 4D electron microscopy;Park,2013
4. High-Contrast Visualization of Graphene Oxide on Dye-Sensitized Glass, Quartz, and Silicon by Fluorescence Quenching
5. Morphological and optical characteristics of nanocrystalline TiO2thin films by quantitative optical anisotropy and imaging techniques
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