1. The limits and extensibility of optical patterned defect inspecction,;Silver,2010
2. Role of local fields and defects in the nonlinear response of metal nanostructures,;Kauranen,2008
3. Near-Field Plates: Subdiffraction Focusing with Patterned Surfaces
4. Near-field optical microscopy characterization of IC metrology,;Toledo-Crow,1994
5. Use of TSOM for sub-11nm node pattern defect detection and HAR features,;Arceo,2013