Studies of PLD-grown ZnO and MBE-grown GaP mosaic thin films by x-ray scattering methods: beyond the restrictive ω rocking curve linewidth as a figure-of-merit-Reference-Cited by-同舟云学术

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Studies of PLD-grown ZnO and MBE-grown GaP mosaic thin films by x-ray scattering methods: beyond the restrictive ω rocking curve linewidth as a figure-of-merit

Published:2011-02-10 Issue: Volume: Page:
ISSN:0277-786X
Container-title:SPIE Proceedings
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Author:

Durand O.,Letoublon A.,Rogers D. J.,Teherani F. Hosseini,Cornet C.,Le Corre A.

Publisher

SPIE

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Quantitative evaluation of microtwins and antiphase defects in GaP/Si nanolayers for a III–V photonics platform on silicon using a laboratory X-ray diffraction setup;Journal of Applied Crystallography;2015-05-31

2. Raman investigation of GaP–Si interfaces grown by molecular beam epitaxy;Thin Solid Films;2013-08

3. Structural and optical properties of (In,Ga)As/GaP quantum dots and (GaAsPN/GaPN) diluted-nitride nanolayers coherently grown onto GaP and Si substrates for photonics and photovoltaics applications;Quantum Sensing and Nanophotonic Devices X;2013-02-04

4. Structural and optical analyses of GaP/Si and (GaAsPN/GaPN)/GaP/Si nanolayers for integrated photonics on silicon;Journal of Applied Physics;2012-09

5. Structural study of GaP layers on misoriented silicon (001) substrates by transverse scan analysis;Journal of Applied Physics;2012-02-15

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