A condition on spatial resolution of IR collimators for testing of thermal imaging systems

Author:

Lee H. C.

Publisher

SPIE-Intl Soc Optical Eng

Subject

General Engineering,Atomic and Molecular Physics, and Optics

Reference6 articles.

1. Specification of Thermal Imagers

2. G. C. Holst, “Infrared imaging system testing,” Chap. 4 inThe Infrared & Electro-Optical Systems Handbook, M. C. Dudzik, Ed., Vol. 4, pp. 206–207, SPIE (1993).

3. G. C. Holst,Testing and Evaluation of Infrared Imaging Systems, JCD Publishing Company (1993).

4. R. Hudson,Infrared Systems Engineering, p. 228, Wiley-Interscience, New York (1969).

5. J. M. Lloyd, “Fundamentals of electro-optical imaging systems analysis,” Chap. 1 inThe Infrared & Electro-Optical Systems Handbook, M. C. Dudzik, Ed., Vol. 4, pp. 206–207, SPIE (1993).

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1. Design of low-light-level resolution testing and comparing system;AOPC 2017: Optical Sensing and Imaging Technology and Applications;2017-10-24

2. Optical design and tolerance analysis of a new off-axis infrared collimator;International Journal of Precision Engineering and Manufacturing;2014-09

3. Measurement error of the minimum resolvable temperature difference of a thermal-vision channel;Journal of Optical Technology;2007-05-01

4. Evaluation of infrared collimators for testing thermal imaging systems;Opto-Electronics Review;2007-01-01

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