Efficient scattering simulations for equivalent extreme ultraviolet mask multilayer structures by modified transmission line theory and finite-difference time-domain method

Author:

Lee Yen-Min

Publisher

SPIE-Intl Soc Optical Eng

Subject

Electrical and Electronic Engineering,Mechanical Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference30 articles.

1. International Technology Roadmap for Semiconductors, http://public.itrs.net.

2. P. Y. Yan , “Masks for extreme ultraviolet lithography,” Chap. 11 inHandbook of Photomask Manufacturing Technology, S. Rizvi , Ed., CRC press, San Jose, CA (2005).

3. Mo/Si multilayers with enhanced TiO 2 - and RuO 2 -capping layers

4. EUV mask process development and integration

5. V. Bakshi , “EUV sources for lithography,” Chap. 8 inZ∗Code for DPP and LPP Source Modeling, pp. 224–269, SPIE Optical Engineering Press, Bellingham, WA (2006).

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