Local (nanometric) quantification of the optical properties of SiO2 dielectric layers with scattering scanning nearfield optical microscope
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SPIE
Reference7 articles.
1. Near-field microscopy by elastic light scattering from a tip
2. Modern Scattering-Type Scanning Near-Field Optical Microscopy for Advanced Material Research;Chen;Adv. Mater,2019
3. Generalized lock-in detection for interferometry: application to phase sensitive spectroscopy and near-field nanoscopy
4. Nanoscale-resolved subsurface imaging by scattering-type near-field optical microscopy
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