X-ray dark-field tomography using edge-illumination-Reference-Cited by-同舟云学术

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X-ray dark-field tomography using edge-illumination

Published:2022-11-10 Issue: Volume: Page:
ISSN:
Container-title:Developments in X-Ray Tomography XIV
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Author:

Doherty Adam,Savidis Savvis,Astolfo Alberto,Massimi Lorenzo,Djurabekova Nargiza,Navarrete Leon Carlos,Gerli Mattia,Iacoviello Francesco,Shearing Paul,Norman Danielle,Williams Mark A.,Olivo Alessandro,Endrizzi Marco

Publisher

SPIE

Reference14 articles.

1. A new DEI algorithm capable of investigating sub-pixel structures

2. Hard-X-ray dark-field imaging using a grating interferometer

3. Hard X-ray dark-field imaging with incoherent sample illumination

4. Detection of individual sub-pixel features in edge-illumination x-ray phase contrast imaging by means of the dark-field channel

5. Dynamic Multicontrast X-Ray Imaging Method Applied to Additive Manufacturing

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Joint multi-contrast CT for edge illumination X-ray phase contrast imaging using split Barzilai-Borwein steps;Optics Express;2024-01-02

2. Increased material differentiation through multi-contrast x-ray imaging: a preliminary evaluation of potential applications to the detection of threat materials;Physica Scripta;2023-08-01

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