Digital image forgery detection under complex lighting using Phong reflection model-Reference-Cited by-同舟云学术

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Digital image forgery detection under complex lighting using Phong reflection model

Published:2022-01-11 Issue:05 Volume:31 Page:
ISSN:1017-9909
Container-title:Journal of Electronic Imaging
language:
Short-container-title:J. Electron. Imag.

Author:

Rani Anuj¹,Jain Ajit¹

Affiliation:

1. Banasthali Vidyapith, Department of Computer Science, Tonk, Rajasthan

Publisher

SPIE-Intl Soc Optical Eng

Subject

Electrical and Electronic Engineering,Computer Science Applications,Atomic and Molecular Physics, and Optics

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. End-to-end image splicing localization based on multi-scale features and residual refinement module;Journal of Electronic Imaging;2023-11-17

2. Unmasking the digital deception - a comprehensive survey on image forgery and detection techniques;Australian Journal of Forensic Sciences;2023-11-15

3. Image Forgery Detection;2023 International Conference on Disruptive Technologies (ICDT);2023-05-11

4. MiniNet: a concise CNN for image forgery detection;Evolving Systems;2022-06-24

5. Passive Framework of Sparse Region Duplication Detection from Digital Images;Journal of Sensors;2022-06-22

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