Measurement Of Scattering Distribution For Characterization Of The Roughness Of Coated Or Uncoated Substrates-Reference-Cited by-同舟云学术

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Measurement Of Scattering Distribution For Characterization Of The Roughness Of Coated Or Uncoated Substrates

Published:1986-10-13 Issue: Volume: Page:
ISSN:0277-786X
Container-title:Thin Film Technologies II
language:
Short-container-title:

Author:

Roche F¹,Amra C¹,Pelletier E¹

Affiliation:

1. Domaine Universitaire de St Jerome (France)

Publisher

SPIE

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Surfaces. Local defects and roughness;Journal of Optics;1993-09

2. Polishing process-local defects and roughness: I.-local defects;Journal of Optics;1993-07

3. Calculation and measurement of scattering for investigation of microroughness in optical coatings;Journal of Optics;1990-05

4. Scattering study of single layer titania films;Applied Optics;1989-07-15

5. Description of a scattering apparatus: application to the problems of characterization of opaque surfaces;Applied Optics;1989-07-15

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