Publisher
SPIE-Intl Soc Optical Eng
Subject
General Engineering,Atomic and Molecular Physics, and Optics
Cited by
16 articles.
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1. A simple method to calculate incident dose for the proximity effect correction;The European Physical Journal Applied Physics;2022
2. Degassing and Cycling of Mercury at Nisyros Volcano (Greece);Geofluids;2019-08-14
3. Electron Beam Lithography of Nanostructures;Reference Module in Materials Science and Materials Engineering;2016
4. Variation of backscatter electron intensity;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2013-11
5. Proximity error correction method for continuous moving stage electron beam writing;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2012-09