Advanced characterization of 2D materials using SEM image processing and machine learning-Reference-Cited by-同舟云学术

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Advanced characterization of 2D materials using SEM image processing and machine learning

Published:2024-04-10 Issue: Volume:1 Page:31
ISSN:
Container-title:Metrology, Inspection, and Process Control XXXVIII
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Author:

Saib Mohamed,Moussa Alain,Beggiato Matteo,Groven Benjamin,Medina Silva Henry,Morin Pierre,Bogdanowicz Janusz,Sankar Kar Gouri,Charley Anne-Laure

Publisher

SPIE

Reference18 articles.

1. High performance photodetector based on graphene/MoS2/graphene lateral heterostrurcture with Schottky junctions

2. High-Efficiency Photodetector Based on a CVD-Grown WS₂ Monolayer

3. Tuneable electronic properties in graphene

4. 2D material-based sensing devices: an update

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Trends in e-beam metrology and inspection;Metrology, Inspection, and Process Control XXXVIII;2024-04-10

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