Geometric measurement error tests on full information of nanoscale surface with the use of scanning electron microscope-Reference-Cited by-同舟云学术

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Geometric measurement error tests on full information of nanoscale surface with the use of scanning electron microscope

Published:2023-01-04 Issue: Volume: Page:
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Container-title:Optoelectronic Imaging and Multimedia Technology IX
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Author:

Zhou Sen,Tao Lei,Li Ying,Yue Cong

Publisher

SPIE

Reference10 articles.

1. “Structured”, “Textured” or “Engineered” Surfaces

2. Advances in engineered surfaces for functional performance

3. Semi-automatic size measurement of primary particles in aggregated nanomaterials by transmission electron microscopy

4. Principle of 3-D imaging techniques [M];Schwarte,1999

5. ISO 19749-2021. Nanotechnologies- Measurements of particle size and shape distributions by scanning electron microscopy.

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