1. Multidimensional interferometric tool for the local probe microscopy nanometrology
2. Design and characterization of MIKES metrological atomic force microscope;Korpelainen,2010
3. Traceable calibration of transfer standards for scanning probe microscopy;Haycocks,2005
4. A fully elastically guided 3-D CMM with a measuring volume or 1 cm(3);Jansen,1999
5. Advances in the development of the LNE metrological atomic force microscope;Poyet,2010