Learning local feature descriptors through ranking losses improved by variance shrinkage
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Published:2018-05-18
Issue:03
Volume:27
Page:1
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ISSN:1017-9909
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Container-title:Journal of Electronic Imaging
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language:
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Short-container-title:J. Electron. Imag.
Author:
Zhang Dalong1,
Zhao Lei1,
Li Wei1,
Xu Duanqing1,
Lu Dongming1
Affiliation:
1. Zhejiang University, College of Computer Science and Technology, Hangzhou
Publisher
SPIE-Intl Soc Optical Eng
Subject
Electrical and Electronic Engineering,Computer Science Applications,Atomic and Molecular Physics, and Optics