Chemomechanical polishing methods and surface metrology of cadmium zinc telluride substrates suitable for IRFPA production-Reference-Cited by-同舟云学术

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Chemomechanical polishing methods and surface metrology of cadmium zinc telluride substrates suitable for IRFPA production

Published:2019-05-14 Issue: Volume: Page:
ISSN:
Container-title:Infrared Technology and Applications XLV
language:
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Author:

Sheahan T.,Martinez Rebecca,Cooper M. D.,MacKenzie J.,Burgess L.,Kumar F. J.,Furlong M. J.

Publisher

SPIE

Reference17 articles.

1. Key issues in HgCdTe-based focal plane arrays: An industry perspective

2. Recent progress in infrared detector technologies

3. Type II strained layer superlattice: A potential future IR solution

4. Next decade in infrared detectors;Rogalski,2017

5. Bulk growth and surface characterization of epitaxy ready cadmium zinc telluride substrates for use in IR imaging applications;Flint,2016

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