Author:
Il'chuk H.,Kashuba A.,Petrus R.,Semkiv I.,Ukrainets N.
Abstract
The spectral dependence of the transmittance as a function of the film thickness, the refractive index of the substrate, bandgap and the Cauchy parameters (α and β) of the semiconductor material was determined from condition of interference extremes. The absorption coefficient was simulated for the structure – thin film/substrate. Cadmium chalcogenides (CdTe, CdSe, and CdS) deposited on quartz substrates was selected as model samples. Experimental behavior of substrate transmittance was used to determine its refractive index. The theoretical results are compared with the experimental data and shows good agreement.
Publisher
Vasyl Stefanyk Precarpathian National University
Subject
Physical and Theoretical Chemistry,Condensed Matter Physics,General Materials Science
Cited by
4 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献