Investigation of The Effect of Annealing on Resistivity in Aluminum-based Amorphous Alloys
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Published:2019-12-15
Issue:4
Volume:20
Page:391-395
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ISSN:2309-8589
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Container-title:Фізика і хімія твердого тіла
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language:
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Short-container-title:PCSS
Author:
Kerli S.,Alver Ü.,Gögebakan M.
Abstract
In this study, electrical properties of Al-Y-Ni alloys produced by melt-spinning method were investigated. Before annealing, XRD analyzes were performed and the samples were found to be amorphous. Exothermic peaks were observed in DSC measurements and crystallization stages of the alloys were determined. Al85Y11Ni4, Al85Y10Ni5 and Al85Y5Ni10 samples were annealed at some temperature and their electrical resistivity was measured by four-point method. The large decrease in resistivity was observed during crystallization between 200 - 400 ˚C. These results were consistent with XRD and DSC measurements.
Publisher
Vasyl Stefanyk Precarpathian National University
Subject
Physical and Theoretical Chemistry,Condensed Matter Physics,General Materials Science