Electron and ion temperature measurement with a new x-ray imaging crystal spectrometer on WEST

Author:

Da Ros A.1ORCID,Vezinet D.1ORCID,Colledani G.1,Fenzi-Bonizec Christel1ORCID,Moureau G.1,Bertschinger G.2ORCID,

Affiliation:

1. CEA, IRFM 1 , F-13108 Saint-Paul-lez-Durance, France

2. Bertschinger GmbH & Co. KG 2 , D-78554 Aldingen, Germany

Abstract

A new x-ray imaging crystal spectrometer (XICS) has been installed, aligned, and used during experimental campaigns on the WEST tokamak. It has three interchangeable crystals for measuring the Ar XVII, Ar XVIII, and Fe XXV spectra, respectively. A patented rotating table holding the crystals is used to monitor the crystal facing the plasma remotely and without changing the position of the camera. Here, the focus is made on the Ar XVII spectrum, between 3.93 and 4.00 Å. The design of the diagnostic is presented, and a synthetic diagnostic, implemented with the Python library ToFu, is used to show the instrument’s operational performance and limits. The instrument function exhibits the following two main features: a distortion for the Ar XVII spectrum, presumably due to the crystal manufacturing in two parts, and the measurement of three W spectral lines on the Ar XVI spectrum. Line of sight-integrated profiles of the electron and ion temperatures are thus extracted from the Ar XVII spectrum from two distinct spectral line ratios and from the Doppler broadening, respectively. The bremsstrahlung emission and the W line measurements are the two main limitations to compute the electron temperature. Tomographic inversions are also implemented with the library ToFu and used in order to obtain the local electron and ion temperature profiles, which are compared to other measurements from the WEST ECE (electron cyclotron emission) diagnostic. It is shown that both the XICS line-integrated and ECE Te measurements are in better agreement. Systematic differences are shown between the electron temperature profiles calculated from the two available line ratios.

Funder

Euratom Research and Training Programme

Publisher

AIP Publishing

Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370

www.globalauthorid.com

TOP

Copyright © 2019-2024 北京同舟云网络信息技术有限公司
京公网安备11010802033243号  京ICP备18003416号-3