Differences in radiation damage to carrier lifetimes in the neutral and depletion regions of InGaP and GaAs solar cells

Abstract

We investigated the radiation damage to carrier lifetimes in the neutral and depletion regions of the InGaP and GaAs subcells of an InGaP/GaAs/Ge triple-junction solar cell. It is difficult to clarify the degradation characteristics of the carrier lifetime in each region using the conventional analysis method (e.g., the dark current–voltage characteristic analysis), so we propose a novel method using the internal luminescence efficiency. The radiation damage coefficients for the carrier lifetimes in the neutral region of InGaP and GaAs subcells were two or three orders of magnitude larger than those in the depletion region. This result suggests that the effective radiation-induced defects in the regions, which significantly impact a solar cell's electrical characteristics, differ. This paper discusses the effective radiation-induced defects that contribute to the output degradation in each region. We compare the radiation damage coefficients for the carrier lifetimes obtained in our analysis, the product of the capture cross section, and the defect introduction coefficient of each defect reported in previous studies.