Robust atomic force microscopy using multiple sensors-Reference-Cited by-同舟云学术

Robust atomic force microscopy using multiple sensors

Published:2016-08 Issue:8 Volume:87 Page:083704
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Baranwal Mayank¹,Gorugantu Ram S.¹,Salapaka Srinivasa M.¹^ORCID

Affiliation:

1. Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA

Funder

National Science Foundation (NSF)

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://scitation.aip.org/deliver/fulltext/aip/journal/rsi/87/8/1.4960714.pdf?itemId=/content/aip/journal/rsi/87/8/10.1063/1.4960714&mimeType=pdf&containerItemId=content/aip/journal/rsi

Reference47 articles.

1. High-speed atomic force microscopy coming of age

2. M. Baranwal, “Application of field programmable analog arrays (FPAAS) to fast scanning probe microscopy,” M.S. thesis, University of Illinois at Urbana-Champaign, 2014.

3. Fast and robust control of nanopositioning systems: Performance limits enabled by field programmable analog arrays

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