Double sample holder for efficient high-resolution studies of an insulator and a metal surface
Author:
Affiliation:
1. Fachbereich Physik, Universität Osnabrück, Barbarastrasse 7, 49076 Osnabrück, Germany
Funder
Deutsche Forschungsgemeinschaft
Publisher
AIP Publishing
Subject
Instrumentation
Link
https://aip.scitation.org/doi/pdf/10.1063/5.0041172
Reference29 articles.
1. On-surface chemical reactions characterised by ultra-high resolution scanning probe microscopy
2. Scanning probe microscopy for advanced nanoelectronics
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5. Van der Waals interactions and the limits of isolated atom models at interfaces
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