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Bulk sensitive hard x-ray photoemission electron microscopy

  • Published:2014-11 Issue:11 Volume:85 Page:113704
  • ISSN:0034-6748
  • Container-title:Review of Scientific Instruments
  • language:en
  • Short-container-title:Review of Scientific Instruments

Author:

Patt M.1,Wiemann C.1,Weber N.2,Escher M.2,Gloskovskii A.3,Drube W.3,Merkel M.2,Schneider C. M.14

Affiliation:

1. Peter Grünberg Institute (PGI-6) and JARA-FIT, Research Center Jülich, D-52425 Jülich, Germany

2. Focus GmbH, Neukirchner Str. 2, D-65510 Hünstetten, Germany

3. DESY Photon Science, Deutsches Elektronen-Synchrotron, D-22603 Hamburg, Germany

4. Fakultät f. Physik and Center for Nanointegration Duisburg-Essen (CeNIDE), Universität Duisburg-Essen, D-47048 Duisburg, Germany

Funder

Deutsche Forschungsgemeinschaft (DFG)

Publisher

AIP Publishing

Subject

Instrumentation

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1. Resistive Switching Systems: A Spectromicroscopy Approach;physica status solidi (a);2023-12-08

2. Development of a Photoemission Microscopy Apparatus Using a Vacuum Ultraviolet Laser;e-Journal of Surface Science and Nanotechnology;2023-10-12

3. Imaging buried objects with the hard/soft x-ray photoemission electron microscope;Journal of Applied Physics;2021-11-07

4. Contrast Inversion of Photoelectron Spectro-microscopy Image;e-Journal of Surface Science and Nanotechnology;2021-05-13

5. Hard x-ray photoelectron spectroscopy: a snapshot of the state-of-the-art in 2020;Journal of Physics: Condensed Matter;2021-05-13
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