Author:
Ramspeck Klaus,Komp Lothar,Dauwe Stefan,Bothe Karsten,Hinken David,Wolf Martin,Meixner Michael
Reference8 articles.
1. S.M. Sze, Semiconductor devices: Physics and Technology (John Wiley & Sons, 2nd edition, 2002), p. 54.
2. D. K. Schroder, Semiconductor material and device characterization (Wiley-IEEE Press, 2015), pp. 61ff.
3. A. L. Blum, R. A. Sinton, W. Dobson, H. Wilterdink and J. H. Dinger, “Lifetime and substrate doping measurements of solar cells and application to in-line process control” in Proc. of IEEE 43rd Photovoltaic Specialists Conference (PVSC) (Portland, OR, 2016) pp. 3534–3537.
4. Application of junction capacitance measurements to the characterization of solar cells
5. Determination of the Base-Dopant Concentration of Large-Area Crystalline Silicon Solar Cells