Irreversible event-based model for thermal emission of electrons from isolated traps-Reference-Cited by-同舟云学术

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Irreversible event-based model for thermal emission of electrons from isolated traps

Published:2009-05-15 Issue:10 Volume:105 Page:103706
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Dimitrijev Sima

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3132094

Reference14 articles.

1. Statistics of the Recombinations of Holes and Electrons

2. Electron-Hole Recombination in Germanium

3. THERMAL EMISSION RATES OF CARRIERS AT GOLD CENTERS IN SILICON

4. Complex nature of gold-related deep levels in silicon

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Particle-Based Device Modeling;2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM);2020-04

2. Experimental Observation of Intrinsic Localized Modes in Germanium;Quodons in Mica;2015

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