Amplitude modulation atomic force microscopy based on higher flexural modes-Reference-Cited by-同舟云学术

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Amplitude modulation atomic force microscopy based on higher flexural modes

Published:2017-12 Issue:12 Volume:7 Page:125319
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Zhou Xilong¹²,Zhuo Rongshu¹²,Wen Pengfei¹²,Li Faxin³

Affiliation:

1. Department of Engineering Structure & Mechanics, School of Science, Wuhan University of Technology, Wuhan, Hubei 430070, China

2. Hubei Key Laboratory of Theory and Applications of Advanced Materials Mechanics, Wuhan University of Technology, Wuhan, Hubei 430070, China

3. College of Engineering, Peking University, Beijing 100871, China

Funder

National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.5004732

Reference23 articles.

1. Amplitude Modulation Atomic Force Microscopy

2. Dynamic atomic force microscopy methods

3. Hysteresis generated by attractive interaction: oscillating behavior of a vibrating tip–microlever system near a surface

4. Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy

5. Dynamics of a vibrating tip near or in intermittent contact with a surface

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. A novel approach to measuring local mechanical properties via photothermal excitation of an atomic force microscope probe using an optical pump–probe inspired design;AIP Advances;2023-10-01

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