A polarized digital shearing speckle pattern interferometry system based on temporal wavelet transformation
Author:
Affiliation:
1. Key Laboratory of Luminescence and Optical Information of Ministry of Education, Beijing Jiaotong University, Beijing 100044, China
Funder
National Natural Science Foundation of China (NSFC)
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4929533
Reference20 articles.
1. Shearography: An optical measurement technique and applications
2. Real-time shearography for measuring time-dependent displacement derivatives
3. Review of electronic speckle pattern interferometry (ESPI) for three dimensional displacement measurement
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