Characterization of the temperature dependence of the thermoreflectance coefficient for conductive thin films
Author:
Affiliation:
1. Baskin School of Engineering, University of California, Santa Cruz, California 95064, USA
2. Birck Nanotechnology Center, Purdue University, West Lafayette, Indiana 47907, USA
Funder
U.S. Department of Energy (DOE)
Defense Advanced Research Projects Agency (DARPA)
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/am-pdf/10.1063/1.4907354
Reference29 articles.
1. Theoretical and experimental investigation of the thermal resolution and dynamic range of CCD-based thermoreflectance imaging
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4. CCD-based thermoreflectance microscopy: principles and applications
5. High temperature thermoreflectance imaging and transient Harman characterization of thermoelectric energy conversion devices
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