Thin film absorption characterization by focus error thermal lensing-Reference-Cited by-同舟云学术

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Thin film absorption characterization by focus error thermal lensing

Published:2017-12 Issue:12 Volume:88 Page:123104
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Domené Esteban A.¹²,Schiltz Drew³,Patel Dinesh³,Day Travis³,Jankowska E.³,Martínez Oscar E.¹²,Rocca Jorge J.³,Menoni Carmen S.³

Affiliation:

1. Laboratorio de Fotónica, Departamento de Física, Facultad de Ingeniería, UBA, Paseo Colón Av. Paseo Colón 850, C1063ACV Buenos Aires, Argentina

2. Consejo Nacional de Investigaciones Científicas y Técnicas (CONICET), Godoy Cruz 2290, C1425FQB Buenos Aires, Argentina

3. Department of Electrical and Computer Engineering, Colorado State University, Fort Collins, Colorado 80523, USA

Funder

DOD | U.S. Air Force

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/am-pdf/10.1063/1.5012915

Reference34 articles.

1. Point defects in Sc2O3 thin films by ion beam sputtering

2. Spontaneous and induced absorption in amorphous Ta 2 O 5 dielectric thin films

3. Spectrophotometric studies of ultra low loss optical glasses I: single beam method

4. Development of a Calorimetric Method for Making Precision Optical Absorption Measurements

5. Laser photothermal spectroscopy of light-induced absorption

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1. Non-contact optical probe with nanometer resolution and large measurement range based on the astigmatism method;Measurement;2023-11

2. FOCUS ERROR MEASUREMENT SYSTEM: PRACTICAL DESIGN CONSIDERATIONS;Anales AFA;2023-01-15

3. Thermal lensing: outside of the lasing medium;Applied Physics B;2022-01-08

4. Device for real-time monitoring of oil-in-water and suspended solids based on thermal lens spectrometry and light scattering;Applied Optics;2020-03-19

5. Transparent glass slab thickness measurement by binary-spot focus signal;Optica Pura y Aplicada;2019-12-31

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