Electron spin resonance of separation by implanted oxygen oxides: Evidence for structural change and a deep electron trap
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.106809
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1. Electron spin resonance study of E' trapping centers in SIMOX buried oxides
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4. High‐field transport in SiO2on silicon induced by corona charging of the unmetallized surface
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