Anisotropic optical properties of free and bound excitons in highly strained A-plane ZnO investigated with polarized photoreflectance and photoluminescence spectroscopy
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2930683
Reference20 articles.
1. Control of crystal polarity in a wurtzite crystal: ZnO films grown by plasma-assisted molecular-beam epitaxy on GaN
2. Spontaneous polarization and piezoelectric constants of III-V nitrides
3. Photoluminescence and cathodoluminescence studies of stoichiometric and oxygen-deficient ZnO films
4. Nonpolar a-plane p-type GaN and p-n Junction Diodes
5. High contrast, ultrafast optically addressed ultraviolet light modulator based upon optical anisotropy in ZnO films grown on R-plane sapphire
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