Advanced interferometric profile measurements through refractive media
Author:
Publisher
AIP Publishing
Subject
Instrumentation
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2. Long-distance polarizing microscope system combined with solenoid-type magnet for microscopy and simultaneous measurement of physical parameters;Review of Scientific Instruments;2022-07-01
3. SURFACE ROUGHNESS OF ELECTROSPUN NANOFIBROUS MATS BY A NOVEL IMAGE PROCESSING TECHNIQUE;Surface Review and Letters;2019-01
4. Surface measurement through transparent medium using Linnik type white-light spectral interferometer;Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018);2018-07-24
5. Xurography for microfluidics on a reactive solid;Lab on a Chip;2017
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