Line shapes for attachment of threshold electrons to SF6 and CFCl3: Threshold photoelectron (TPSA) studies of Xe, CO, and C2H2
Author:
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.438473
Reference22 articles.
1. High‐resolution threshold photoelectron spectroscopy by electron attachment
2. Studies of Ar and N2 using threshold photoelectron spectroscopy by electron attachment (TPSA)
3. The origin and elimination of spurious peaks in threshold electron photoionization spectra
4. Threshold Photoelectron Detector for Use in the Vacuum Ultraviolet
5. Photoionization and ion cyclotron resonance studies of the reaction C2H4+ + C2H4 → C3H5+ + CH3
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