Feasibility of transmission x-ray microscopy at 4 keV with spatial resolutions below 150 nm-Reference-Cited by-同舟云学术

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Feasibility of transmission x-ray microscopy at 4 keV with spatial resolutions below 150 nm

Published:1999-12-27 Issue:26 Volume:75 Page:4061-4063
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Kaulich B.,Oestreich S.,Salome M.,Barrett R.,Susini J.,Wilhein T.,Di Fabrizio E.,Gentili M.,Charalambous P.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.125536

Reference10 articles.

1. New high‐resolution zone‐plate microscope at beamline 6.1 of the ALS

2. X-ray microscopy in aarhus with 30 NM resolution

3. Single-movement fixed-exit channelcut x-ray monochromator based on profiled surfaces

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