Grain growth study in aluminum films and electromigration implications
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.335366
Reference8 articles.
1. ELECTROMIGRATION IN SINGLE‐CRYSTAL ALUMINUM FILMS
2. Statistical Metallurgical Model for Electromigration Failure in Aluminum Thin‐Film Conductors
3. Linewidth dependence of electromigration in evaporated Al‐0.5%Cu
4. Electromigration in aluminum conductors which are chains of single crystals
5. Electromigration lifetime sudies of submicrometer-linewidth Al-Cu conductors
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