Characterization of thin films using numerical inversion of the generalized Lamb wave dispersion relation
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.109209
Reference11 articles.
1. Cut‐off characteristics of leaky Sezawa and pseudo‐Sezawa wave modes for thin‐film characterization
2. Line focus acoustic microscopy to measure anisotropic acoustic properties of thin films
3. Inversion of leaky Lamb wave data to determine cohesive properties of bonds
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