Relationship among reflectance‐difference spectroscopy, surface photoabsorption, and spectroellipsometry
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.109890
Reference22 articles.
1. Assessment byinsituellipsometry of composition profiles of Ga1−xAlxAs‐GaAs heterostructures x
2. Above-bandgap optical anisotropies in cubic semiconductors: A visible–near ultraviolet probe of surfaces
3. Optical reflectance and electron diffraction studies of molecular-beam-epitaxy growth transients on GaAs(001)
4. Spectral Dependence of Optical Reflection during Flow-Rate Modulation Epitaxy of GaAs by the Surface Photo-Absorption Method
5. Application of ellipsometry to crystal growth by organometallic molecular beam epitaxy
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