Aberration-Corrected Imaging in Transmission Electron Microscopy: An IntroductionAberration-Corrected Imaging in Transmission Electron Microscopy: An Introduction, Rolf ErniImperial College Press, London, 2010. $88.00 (354 pp.). ISBN 978-1-84816-536-6
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Published:2011-07
Issue:7
Volume:64
Page:55-56
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ISSN:0031-9228
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Container-title:Physics Today
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language:en
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Short-container-title:Physics Today
Subject
General Physics and Astronomy
Cited by
1 articles.
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