Process dispersion monitoring: Innovative AEWMA control chart in semiconductor manufacturing

Author:

Khan Imad1ORCID,Noor-ul-Amin Muhammad2ORCID,Aslam Muhammad Usman3,Mostafa Almetwally M.4ORCID,Ahmad Bakhtiyar5ORCID

Affiliation:

1. Department of Statistics, Abdul Wali Khan University Mardan 1 , Mardan 23200, Pakistan

2. Department of Statistics, COMSATS University Lahore Campus 2 , Lahore 54000, Pakistan

3. Department of Statistics, Xi’an Jiaotong University 3 , Xi’an 710032, China

4. Department of Information Systems, College Computers and Information Science, King Saud University 4 , Riyadh 11574, Saudi Arabia

5. Higher Education Department 5 , Kabul 1001, Afghanistan

Abstract

This study introduces a novel adaptive exponentially weighted moving average (AEWMA) control chart for monitoring process dispersion, employing adaptation to determine the smoothing constant. It is designed to effectively track shifts within expected ranges in process dispersion by computing the smoothing constant through a suggested adaptive approach. To determine its efficacy, the chart’s performance is evaluated by using smaller run-length profiles derived from Monte Carlo simulations. A key feature is the utilization of an unbiased estimator to calculate the smoothing constant via the proposed function, enhancing the chart’s ability to detect various magnitudes of decreasing and increasing process dispersion shifts. A comparison with an existing adaptive EWMA dispersion chart underscores the significant efficiency of the proposed chart across various types of process dispersion shift magnitudes. Moreover, the study encompasses a real-life dataset application, demonstrating the practical implementation and ease of use in real-world scenarios.

Funder

King Saud University

Publisher

AIP Publishing

Cited by 1 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Modified exponentially weighted moving average control chart for monitoring process dispersion;Communications in Statistics - Simulation and Computation;2024-05-24

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