Theoretical and experimental study of the dark signal in CMOS image sensors affected by neutron radiation from a nuclear reactor-Reference-Cited by-同舟云学术

Theoretical and experimental study of the dark signal in CMOS image sensors affected by neutron radiation from a nuclear reactor

Published:2017-12 Issue:12 Volume:7 Page:125222
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Xue Yuanyuan¹,Wang Zujun¹,He Baoping¹,Yao Zhibin¹,Liu Minbo¹,Ma Wuying¹,Sheng Jiangkun¹,Dong Guantao¹,Jin Junshan¹

Affiliation:

1. State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, P.O.Box 69-10, Xi’an, Shaanxi 710024, China

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4999664

Reference12 articles.

1. Overview of Ionizing Radiation Effects in Image Sensors Fabricated in a Deep-Submicrometer CMOS Imaging Technology

2. Characterization of CMOS Active Pixel Sensors for particle detection: Beam test of the four-sensors RAPS03 stacked system

3. Development of a high-speed camera system for neutron imaging at a pulsed neutron source

4. Total dose and displacement damage effects in a radiation-hardened CMOS APS

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