Apertureless scanning microscope probe as a detector of semiconductor laser emission-Reference-Cited by-同舟云学术

Apertureless scanning microscope probe as a detector of semiconductor laser emission

Published:2015-04-27 Issue:17 Volume:106 Page:171105
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Dunaevskiy Mikhail¹²^ORCID,Dontsov Anton¹,Alekseev Prokhor¹³^ORCID,Monakhov Andrei¹,Baranov Alexei⁴,Girard Paul⁴,Arinero Richard⁴^ORCID,Teissier Roland⁴,Titkov Alexander¹³

Affiliation:

1. Ioffe Institute, Saint-Petersburg 194021, Russia

2. National Research University of Information Technologies, Mechanics and Optics (ITMO), Saint-Petersburg 197101, Russia

3. Saint Petersburg Electrotechnical University "LETI," Saint-Petersburg 197376, Russia

4. Institut d'Electronique du Sud, UMR 5214 UM2-CNRS, CC082, Université Montpellier 2, 34095 Montpellier Cedex 5, France

Funder

Franco-Russain International Associated Laboratory ILNACS

Goverment of Russian Federation

Presidential Program of Support for Leading Scientific Schools

Russian Foundation for Basic Research (RFBR)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4919528

Reference8 articles.

1. Optomechanical uncooled infrared imaging system: design, microfabrication, and performance

2. Performance of uncooled microcantilever thermal detectors

3. Impact of silicon nitride thickness on the infrared sensitivity of silicon nitride–aluminum microcantilevers

4. Detection of pulsed far-infrared and terahertz light with an atomic force microscope

5. Near field imaging of a semiconductor laser by scanning probe microscopy without a photodetector

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